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Auger electron spectroscopy and x-ray photoelectron spectroscopy analysis of angle of incidence effects of ion beam nitridation of GaAs
Auger electron spectroscopy and x-ray photoelectron spectroscopy analysis of angle of incidence effects of ion beam nitridation of GaAs
Auger electron spectroscopy and x-ray photoelectron spectroscopy analysis of angle of incidence effects of ion beam nitridation of GaAs
Pan, J. S. (author) / Huan, C. H. A. (author) / Wee, A. T. S. (author) / Tan, H. S. (author) / Tan, K. L. (author)
JOURNAL OF MATERIALS RESEARCH -PITTSBURGH- ; 13 ; 1799-1807
1998-01-01
9 pages
Article (Journal)
English
DDC:
620.11
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Reference data for Auger electron spectroscopy and X-ray photoelectron spectroscopy combined
| British Library Online Contents | 1999
Some Issues in Quantitative X-ray Photoelectron Spectroscopy and Auger-Electron Spectroscopy
| British Library Conference Proceedings | 2001
Auger electron and photoelectron spectroscopy of passivating films on thinplate
| British Library Online Contents | 2003
X-ray photoelectron spectroscopy and auger electron spectroscopy studies of Al-doped ZnO films
| British Library Online Contents | 2000
Surface Analysis of Al Alloys with X-Ray Photoelectron and Auger Electron Spectroscopy
| British Library Online Contents | 2015