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    Scanning force microscopy investigation of ion bombarded InP

    New search for: Demanet, C. M.

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    Scanning force microscopy investigation of ion bombarded InP

    New search for: Demanet, C. M.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Scanning force microscopy investigation of ion bombarded InP

    New search for: Demanet, C. M.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
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    Document information
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    Document information
    Title:

    Scanning force microscopy investigation of ion bombarded InP

    Contributors:

    Demanet, C. M. (author)

    Published in:

    APPLIED SURFACE SCIENCE ; 135 ; 53-58

    Publication date:

    1998-01-01

    Size:

    6 pages

    ISSN:

    0169-4332

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  621.35

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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