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    Z-Scan Measurements of Transient and Stationary Optical Nonlinearities in Semiconductor-Metal Nanocomposites

    New search for: Adomavicius, R.
    New search for: Krotkus, A.

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    Z-Scan Measurements of Transient and Stationary Optical Nonlinearities in Semiconductor-Metal Nanocomposites

    New search for: Adomavicius, R.
    New search for: Krotkus, A.

    Access

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    Check availability in my library
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    Z-Scan Measurements of Transient and Stationary Optical Nonlinearities in Semiconductor-Metal Nanocomposites

    New search for: Adomavicius, R.
    New search for: Krotkus, A.

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    Document information
    Title:

    Z-Scan Measurements of Transient and Stationary Optical Nonlinearities in Semiconductor-Metal Nanocomposites

    Contributors:

    Adomavicius, R. (author) / Krotkus, A. (author)

    Published in:

    MATERIALS SCIENCE FORUM ; 297/298 ; 119-122

    Publication date:

    1999-01-01

    Size:

    4 pages

    ISSN:

    0255-5476

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  620.11

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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