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    Charge transient spectroscopy measurements of GaAs metal-insulator-semiconductor structures

    New search for: Kochowski, S.
    New search for: Szydlowski, M.
    New search for: Thurzo, I.
    New search for: Zahn, D. R.

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    Charge transient spectroscopy measurements of GaAs metal-insulator-semiconductor structures

    New search for: Kochowski, S.
    New search for: Szydlowski, M.
    New search for: Thurzo, I.
    New search for: Zahn, D. R.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Charge transient spectroscopy measurements of GaAs metal-insulator-semiconductor structures

    New search for: Kochowski, S.
    New search for: Szydlowski, M.
    New search for: Thurzo, I.
    New search for: Zahn, D. R.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

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    Check availability in my library
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    Document information
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    Document information
    Title:

    Charge transient spectroscopy measurements of GaAs metal-insulator-semiconductor structures

    Contributors:

    Kochowski, S. (author) / Szydlowski, M. (author) / Thurzo, I. (author) / Zahn, D. R. (author)

    Published in:

    APPLIED SURFACE SCIENCE ; 252 ; 7631-7635

    Publication date:

    2006-01-01

    Size:

    5 pages

    ISSN:

    0169-4332

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  621.35

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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