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Atomic force microscope study of carbon thin films prepared by pulsed laser deposition

Yoshitake, T. / Nishiyama, T. / Aoki, H. / Suizu, K. / Takahashi, K. / Nagayama, K.

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Atomic force microscope study of carbon thin films prepared by pulsed laser deposition

Yoshitake, T. / Nishiyama, T. / Aoki, H. / Suizu, K. / Takahashi, K. / Nagayama, K.

Atomic force microscope study of carbon thin films prepared by pulsed laser deposition

Yoshitake, T. / Nishiyama, T. / Aoki, H. / Suizu, K. / Takahashi, K. / Nagayama, K.

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Document information

Title:

Atomic force microscope study of carbon thin films prepared by pulsed laser deposition

Contributors:

Yoshitake, T. (author) / Nishiyama, T. (author) / Aoki, H. (author) / Suizu, K. (author) / Takahashi, K. (author) / Nagayama, K. (author)

Published in:

APPLIED SURFACE SCIENCE ; 141 ; 129-137

Publication date:

1999-01-01

Size:

9 pages

ISSN:

0169-4332

Type of media:

Article (Journal)

Type of material:

Language:

English

Classification:

DDC: 621.35

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