Atomic force microscopy investigations of gadolinia doped ceria thin films prepared by pulsed laser deposition technique: Fid-Bau Portal

Atomic force microscopy investigations of gadolinia doped ceria thin films prepared by pulsed laser deposition technique

Muthukkumaran, K. / Kuppusami, P. / Mathews, T. / Mohandas, E. / Selladurai, S.

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Atomic force microscopy investigations of gadolinia doped ceria thin films prepared by pulsed laser deposition technique

Muthukkumaran, K. / Kuppusami, P. / Mathews, T. / Mohandas, E. / Selladurai, S.

Atomic force microscopy investigations of gadolinia doped ceria thin films prepared by pulsed laser deposition technique

Muthukkumaran, K. / Kuppusami, P. / Mathews, T. / Mohandas, E. / Selladurai, S.

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Check availability in my library

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Document information

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Document information

Title:

Atomic force microscopy investigations of gadolinia doped ceria thin films prepared by pulsed laser deposition technique

Contributors:

Muthukkumaran, K. (author) / Kuppusami, P. (author) / Mathews, T. (author) / Mohandas, E. (author) / Selladurai, S. (author)

Published in:

MATERIALS SCIENCE -WROCLAW- ; 25 ; 671-678

Publication date:

2007-01-01

Size:

8 pages

ISSN:

0137-1339

Type of media:

Article (Journal)

Type of material:

Language:

English

Classification:

DDC: 620.11

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p-Type conductivity in gadolinia-doped ceria

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