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DLTS analysis of nickel-hydrogen complex defects in silicon

Shiraishi, M. / Sachse, J.-U. / Lemke, H. / Weber, J.

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DLTS analysis of nickel-hydrogen complex defects in silicon

Shiraishi, M. / Sachse, J.-U. / Lemke, H. / Weber, J.

DLTS analysis of nickel-hydrogen complex defects in silicon

Shiraishi, M. / Sachse, J.-U. / Lemke, H. / Weber, J.

Access

Access via TIB

Check availability in my library

Order at Subito €

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Document information

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Document information

Title:

DLTS analysis of nickel-hydrogen complex defects in silicon

Contributors:

Shiraishi, M. (author) / Sachse, J.-U. (author) / Lemke, H. (author) / Weber, J. (author) / Weber, J. / Mesli, A.

Published in:

Symposium A Detects in Snmon Hy[?] ; 130-133

MATERIALS SCIENCE AND ENGINEERING -LAUSANNE- B ; 58

Publication date:

1999-01-01

Size:

4 pages

ISSN:

0921-5107

Type of media:

Article (Journal)

Type of material:

Language:

English

Classification:

DDC: 620.11

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