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Failure Analysis Using Microfocus X-ray Imaging

Bossi, R. H.

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Failure Analysis Using Microfocus X-ray Imaging

Bossi, R. H.

Failure Analysis Using Microfocus X-ray Imaging

Bossi, R. H.

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Check availability in my library

Order at Subito €

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Document information

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Document information

Title:

Failure Analysis Using Microfocus X-ray Imaging

Contributors:

Bossi, R. H. (author)

Published in:

JOURNAL OF TESTING AND EVALUATION ; 27 ; 137-142

Publication date:

1999-01-01

Size:

6 pages

ISSN:

0090-3973

Type of media:

Article (Journal)

Type of material:

Language:

English

Classification:

DDC: 620

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Microfocus X-ray computed tomography analysis of corroded glass objects

Mees, F. / Cornelis, E. / Jacobs, P. et al. | British Library Online Contents | 2009