A platform for research: civil engineering, architecture and urbanism
Low energy argon ion-enhanced removal of carbon from silicon dioxide surfaces with atomic deuterium
Low energy argon ion-enhanced removal of carbon from silicon dioxide surfaces with atomic deuterium
Low energy argon ion-enhanced removal of carbon from silicon dioxide surfaces with atomic deuterium
Sampson, G.M. (author) / White, J.M. (author) / Ekerdt, J.G. (author)
APPLIED SURFACE SCIENCE ; 143 ; 30-38
1999-01-01
9 pages
Article (Journal)
English
DDC:
621.35
© Metadata Copyright the British Library Board and other contributors. All rights reserved.
Investigation of ionic contamination removal from silicon dioxide surfaces
British Library Online Contents | 2002
|Deuterium retention in tungsten co-deposits with neon and argon inclusions
Elsevier | 2024
|Deuterium retention in tungsten co-deposits with neon and argon inclusions
DOAJ | 2024
|