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Atomic force microscopic studies of oxide thin films on organic self-assembled monolayers

Niesen, T. P. / De Guire, M. R. / Bill, J. / Aldinger, F. / Ruehle, M. / Fischer, A. / Jentoft, F. C. / Schloegl, R.

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Atomic force microscopic studies of oxide thin films on organic self-assembled monolayers

Niesen, T. P. / De Guire, M. R. / Bill, J. / Aldinger, F. / Ruehle, M. / Fischer, A. / Jentoft, F. C. / Schloegl, R.

Atomic force microscopic studies of oxide thin films on organic self-assembled monolayers

Niesen, T. P. / De Guire, M. R. / Bill, J. / Aldinger, F. / Ruehle, M. / Fischer, A. / Jentoft, F. C. / Schloegl, R.

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Document information

Title:

Atomic force microscopic studies of oxide thin films on organic self-assembled monolayers

Contributors:

Niesen, T. P. (author) / De Guire, M. R. (author) / Bill, J. (author) / Aldinger, F. (author) / Ruehle, M. (author) / Fischer, A. (author) / Jentoft, F. C. (author) / Schloegl, R. (author)

Published in:

JOURNAL OF MATERIALS RESEARCH -PITTSBURGH- ; 14 ; 2464-2475

Publication date:

1999-01-01

Size:

12 pages

ISSN:

0884-2914

Type of media:

Article (Journal)

Type of material:

Language:

English

Classification:

DDC: 620.11

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