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    Unambiguous detection of the adhesive failure of metal films in the microscratch test by waveform analysis of the friction signal

    New search for: Baba, S.
    New search for: Midorikawa, T.
    New search for: Nakano, T.

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    Unambiguous detection of the adhesive failure of metal films in the microscratch test by waveform analysis of the friction signal

    New search for: Baba, S.
    New search for: Midorikawa, T.
    New search for: Nakano, T.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Unambiguous detection of the adhesive failure of metal films in the microscratch test by waveform analysis of the friction signal

    New search for: Baba, S.
    New search for: Midorikawa, T.
    New search for: Nakano, T.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
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    Document information
    Similar titles

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    Document information
    Title:

    Unambiguous detection of the adhesive failure of metal films in the microscratch test by waveform analysis of the friction signal

    Contributors:

    Baba, S. (author) / Midorikawa, T. (author) / Nakano, T. (author)

    Published in:

    APPLIED SURFACE SCIENCE ; 144 ; 344-349

    Publication date:

    1999-01-01

    Size:

    6 pages

    ISSN:

    0169-4332

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  621.35

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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