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    Cold emission characterization using secondary electron emission spectroscopy

    New search for: Yater, J.E.
    New search for: Shih, A.
    New search for: Abrams, R.

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    Cold emission characterization using secondary electron emission spectroscopy

    New search for: Yater, J.E.
    New search for: Shih, A.
    New search for: Abrams, R.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Cold emission characterization using secondary electron emission spectroscopy

    New search for: Yater, J.E.
    New search for: Shih, A.
    New search for: Abrams, R.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Page navigation

    Document information
    Similar titles

    Export, share and cite

    Document information
    Title:

    Cold emission characterization using secondary electron emission spectroscopy

    Contributors:

    Yater, J.E. (author) / Shih, A. (author) / Abrams, R. (author)

    Published in:

    APPLIED SURFACE SCIENCE ; 146 ; 341-346

    Publication date:

    1999-01-01

    Size:

    6 pages

    ISSN:

    0169-4332

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  621.35

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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