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    Electron beam induced secondary emission changes investigated by work function spectroscopy

    New search for: Vida, G.
    New search for: Beck, I.
    New search for: Josepovits, V. K.
    New search for: Gyr, M.
    New search for: Deak, P.

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    Electron beam induced secondary emission changes investigated by work function spectroscopy

    New search for: Vida, G.
    New search for: Beck, I.
    New search for: Josepovits, V. K.
    New search for: Gyr, M.
    New search for: Deak, P.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Electron beam induced secondary emission changes investigated by work function spectroscopy

    New search for: Vida, G.
    New search for: Beck, I.
    New search for: Josepovits, V. K.
    New search for: Gyr, M.
    New search for: Deak, P.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Page navigation

    Document information
    Similar titles

    Export, share and cite

    Document information
    Title:

    Electron beam induced secondary emission changes investigated by work function spectroscopy

    Contributors:

    Vida, G. (author) / Beck, I. (author) / Josepovits, V. K. (author) / Gyr, M. (author) / Deak, P. (author)

    Published in:

    APPLIED SURFACE SCIENCE ; 227 ; 87-93

    Publication date:

    2004-01-01

    Size:

    7 pages

    ISSN:

    0169-4332

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  621.35

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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