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Epitaxial lateral overgrowth of GaN structures: spatially resolved characterization by cathodoluminescence microscopy and micro-Raman spectroscopy
Epitaxial lateral overgrowth of GaN structures: spatially resolved characterization by cathodoluminescence microscopy and micro-Raman spectroscopy
Epitaxial lateral overgrowth of GaN structures: spatially resolved characterization by cathodoluminescence microscopy and micro-Raman spectroscopy
Bertram, F. (author) / Riemann, T. (author) / Christen, J. (author) / Kaschner, A. (author) / Hoffmann, A. (author) / Hiramatsu, K. (author) / Shibata, T. (author) / Sawaki, N. (author)
MATERIALS SCIENCE AND ENGINEERING -LAUSANNE- B ; 59 ; 117 - 121
1999-01-01
5 pages
Article (Journal)
English
DDC:
620.11
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