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    High-resolution electron microscopy investigations of stacking faults in Y~1Ba~2Cu~3O~7~-~ metalorganic chemical vapor deposited thin films

    New search for: Grigis, C.
    New search for: Schamm, S.
    New search for: Dorignac, D.

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    High-resolution electron microscopy investigations of stacking faults in Y~1Ba~2Cu~3O~7~-~ metalorganic chemical vapor deposited thin films

    New search for: Grigis, C.
    New search for: Schamm, S.
    New search for: Dorignac, D.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    High-resolution electron microscopy investigations of stacking faults in Y~1Ba~2Cu~3O~7~-~ metalorganic chemical vapor deposited thin films

    New search for: Grigis, C.
    New search for: Schamm, S.
    New search for: Dorignac, D.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

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    Document information
    Similar titles

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    Document information
    Title:

    High-resolution electron microscopy investigations of stacking faults in Y~1Ba~2Cu~3O~7~-~ metalorganic chemical vapor deposited thin films

    Contributors:

    Grigis, C. (author) / Schamm, S. (author) / Dorignac, D. (author)

    Published in:

    JOURNAL OF MATERIALS RESEARCH -PITTSBURGH- ; 14 ; 2732-2738

    Publication date:

    1999-01-01

    Size:

    7 pages

    ISSN:

    0884-2914

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  620.11

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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