A platform for research: civil engineering, architecture and urbanism
A platform for research: civil engineering, architecture and urbanism
Characterization of Organic Thin Film Materials with Near-Field Scanning Optical Microscopy (NSOM)
Characterization of Organic Thin Film Materials with Near-Field Scanning Optical Microscopy (NSOM)
Characterization of Organic Thin Film Materials with Near-Field Scanning Optical Microscopy (NSOM)
Barbara, P. F. (author) / Adams, D. M. (author) / O'Connor, D. B. (author)
ANNUAL REVIEW OF MATERIALS SCIENCE ; 29 ; 433-470
1999-01-01
38 pages
Article (Journal)
English
DDC:
620.11
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