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Electric current-induced stresses at the crack tip in conductors
Electric current-induced stresses at the crack tip in conductors
Electric current-induced stresses at the crack tip in conductors
Cai, G. X. (author) / Yuan, F. G. (author)
INTERNATIONAL JOURNAL OF FRACTURE ; 96 ; 279-301
1999-01-01
23 pages
Article (Journal)
English
DDC:
620.1126
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