Eine Plattform für die Wissenschaft: Bauingenieurwesen, Architektur und Urbanistik
Eine Plattform für die Wissenschaft: Bauingenieurwesen, Architektur und Urbanistik
Electric current-induced stresses at the crack tip in conductors
Electric current-induced stresses at the crack tip in conductors
Electric current-induced stresses at the crack tip in conductors
Cai, G. X. (Autor:in) / Yuan, F. G. (Autor:in)
INTERNATIONAL JOURNAL OF FRACTURE ; 96 ; 279-301
01.01.1999
23 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
620.1126
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