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Electronic properties of single semiconductor nanocrystals: optical and electrostatic force microscopy measurements

Krauss, T.D. / Brus, L.E.

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Electronic properties of single semiconductor nanocrystals: optical and electrostatic force microscopy measurements

Krauss, T.D. / Brus, L.E.

Electronic properties of single semiconductor nanocrystals: optical and electrostatic force microscopy measurements

Krauss, T.D. / Brus, L.E.

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Check availability in my library

Order at Subito €

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Document information

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Document information

Title:

Electronic properties of single semiconductor nanocrystals: optical and electrostatic force microscopy measurements

Contributors:

Krauss, T.D. (author) / Brus, L.E. (author)

Published in:

MATERIALS SCIENCE AND ENGINEERING -LAUSANNE- B ; 69-70 ; 289 - 294

Publication date:

2000-01-01

Size:

6 pages

ISSN:

0921-5107

Type of media:

Article (Journal)

Type of material:

Language:

English

Classification:

DDC: 620.11

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