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    Application of electrostatic force microscopy in nanosystem diagnostics

    New search for: Gotszalk, T.
    New search for: Grabiec, P.
    New search for: Rangelow, I. W.

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    Application of electrostatic force microscopy in nanosystem diagnostics

    New search for: Gotszalk, T.
    New search for: Grabiec, P.
    New search for: Rangelow, I. W.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Application of electrostatic force microscopy in nanosystem diagnostics

    New search for: Gotszalk, T.
    New search for: Grabiec, P.
    New search for: Rangelow, I. W.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Page navigation

    Document information
    Similar titles

    Export, share and cite

    Document information
    Title:

    Application of electrostatic force microscopy in nanosystem diagnostics

    Contributors:

    Gotszalk, T. (author) / Grabiec, P. (author) / Rangelow, I. W. (author)

    Published in:

    MATERIALS SCIENCE -WROCLAW- ; 21 ; 333-338

    Publication date:

    2003-01-01

    Size:

    6 pages

    ISSN:

    0137-1339

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  620.11

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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