Microstructural Degradation Accompanying Tensile Creep Deformation in Quasi-Ductile Silicon Nitride: Fid-Bau Portal

Microstructural Degradation Accompanying Tensile Creep Deformation in Quasi-Ductile Silicon Nitride

Lofaj, F. / Okada, A. / Ikeda, Y. / Mizuta, Y. / Usami, H. / Kawamoto, H.

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Microstructural Degradation Accompanying Tensile Creep Deformation in Quasi-Ductile Silicon Nitride

Lofaj, F. / Okada, A. / Ikeda, Y. / Mizuta, Y. / Usami, H. / Kawamoto, H.

Microstructural Degradation Accompanying Tensile Creep Deformation in Quasi-Ductile Silicon Nitride

Lofaj, F. / Okada, A. / Ikeda, Y. / Mizuta, Y. / Usami, H. / Kawamoto, H.

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Document information

Title:

Microstructural Degradation Accompanying Tensile Creep Deformation in Quasi-Ductile Silicon Nitride

Contributors:

Lofaj, F. (author) / Okada, A. (author) / Ikeda, Y. (author) / Mizuta, Y. (author) / Usami, H. (author) / Kawamoto, H. (author)

Published in:

KEY ENGINEERING MATERIALS ; 321-334

Publication date:

2000-01-01

Size:

14 pages

ISSN:

1013-9826

Type of media:

Article (Journal)

Type of material:

Language:

English

Classification:

DDC: 620.11

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