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Principle of Low-Energy Electron Beam-Induced Current Imaging for Ferroelectric Thin Films

Lubomirsky, I. / Wang, T. Y. / Gartsman, K. / Stafsudd, O. M.

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Principle of Low-Energy Electron Beam-Induced Current Imaging for Ferroelectric Thin Films

Lubomirsky, I. / Wang, T. Y. / Gartsman, K. / Stafsudd, O. M.

Principle of Low-Energy Electron Beam-Induced Current Imaging for Ferroelectric Thin Films

Lubomirsky, I. / Wang, T. Y. / Gartsman, K. / Stafsudd, O. M.

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Document information

Title:

Principle of Low-Energy Electron Beam-Induced Current Imaging for Ferroelectric Thin Films

Contributors:

Lubomirsky, I. (author) / Wang, T. Y. (author) / Gartsman, K. (author) / Stafsudd, O. M. (author)

Published in:

ADVANCED MATERIALS -DEERFIELD BEACH- ; 12 ; 91-94

Publication date:

2000-01-01

Size:

4 pages

ISSN:

0935-9648

Type of media:

Article (Journal)

Type of material:

Language:

English

Classification:

DDC: 620.11

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