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Domain structure and electrical properties of highly textured PbZr~xTi~1~-~xO~3 thin films grown on LaNiO~3-electrode-buffered Si by metalorganic chemical vapor deposition
Domain structure and electrical properties of highly textured PbZr~xTi~1~-~xO~3 thin films grown on LaNiO~3-electrode-buffered Si by metalorganic chemical vapor deposition
Domain structure and electrical properties of highly textured PbZr~xTi~1~-~xO~3 thin films grown on LaNiO~3-electrode-buffered Si by metalorganic chemical vapor deposition
Lin, C. H. (author) / Yen, B. M. (author) / Kuo, H. C. (author) / Chen, H. (author) / Wu, T. B. (author) / Stillman, G. E. (author)
JOURNAL OF MATERIALS RESEARCH -PITTSBURGH- ; 15 ; 115-124
2000-01-01
10 pages
Article (Journal)
English
DDC:
620.11
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