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    Polishing and Surface Characterization of SiC Substrates

    New search for: Everson, W. J.
    New search for: Snyder, D. W.
    New search for: Heydermann, V. D.

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    Polishing and Surface Characterization of SiC Substrates

    New search for: Everson, W. J.
    New search for: Snyder, D. W.
    New search for: Heydermann, V. D.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Polishing and Surface Characterization of SiC Substrates

    New search for: Everson, W. J.
    New search for: Snyder, D. W.
    New search for: Heydermann, V. D.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

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    Document information
    Similar titles

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    Document information
    Title:

    Polishing and Surface Characterization of SiC Substrates

    Contributors:

    Everson, W. J. (author) / Snyder, D. W. (author) / Heydermann, V. D. (author)

    Published in:

    MATERIALS SCIENCE FORUM ; 338/342 ; 837-840

    Publication date:

    2000-01-01

    Size:

    4 pages

    ISSN:

    0255-5476

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  620.11

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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