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    Characterization of SiC MOS Structures Using Conductance Spectroscopy and Capacitance Voltage Analysis

    New search for: Sveinbjornsson, E. O.
    New search for: Ahnoff, M.
    New search for: Olafsson, H. O.

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    Characterization of SiC MOS Structures Using Conductance Spectroscopy and Capacitance Voltage Analysis

    New search for: Sveinbjornsson, E. O.
    New search for: Ahnoff, M.
    New search for: Olafsson, H. O.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Characterization of SiC MOS Structures Using Conductance Spectroscopy and Capacitance Voltage Analysis

    New search for: Sveinbjornsson, E. O.
    New search for: Ahnoff, M.
    New search for: Olafsson, H. O.

    Access

    Access via TIB
    Check availability in my library
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    Document information
    Title:

    Characterization of SiC MOS Structures Using Conductance Spectroscopy and Capacitance Voltage Analysis

    Contributors:

    Sveinbjornsson, E. O. (author) / Ahnoff, M. (author) / Olafsson, H. O. (author)

    Published in:

    MATERIALS SCIENCE FORUM ; 338/342 ; 1117-1120

    Publication date:

    2000-01-01

    Size:

    4 pages

    ISSN:

    0255-5476

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  620.11

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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