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    Electrical properties of metal/GaN and SiO2/GaN interfaces and effects of thermal annealing

    New search for: Sawada, T.
    New search for: Ito, Y.
    New search for: Imai, K.
    New search for: Suzuki, K.
    New search for: Tomozawa, H.
    New search for: Sakai, S.

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    Electrical properties of metal/GaN and SiO2/GaN interfaces and effects of thermal annealing

    New search for: Sawada, T.
    New search for: Ito, Y.
    New search for: Imai, K.
    New search for: Suzuki, K.
    New search for: Tomozawa, H.
    New search for: Sakai, S.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Electrical properties of metal/GaN and SiO2/GaN interfaces and effects of thermal annealing

    New search for: Sawada, T.
    New search for: Ito, Y.
    New search for: Imai, K.
    New search for: Suzuki, K.
    New search for: Tomozawa, H.
    New search for: Sakai, S.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Page navigation

    Document information
    Similar titles

    Export, share and cite

    Document information
    Title:

    Electrical properties of metal/GaN and SiO2/GaN interfaces and effects of thermal annealing

    Contributors:

    Sawada, T. (author) / Ito, Y. (author) / Imai, K. (author) / Suzuki, K. (author) / Tomozawa, H. (author) / Sakai, S. (author)

    Published in:

    APPLIED SURFACE SCIENCE ; 159-160 ; 449-455

    Publication date:

    2000-01-01

    Size:

    7 pages

    ISSN:

    0169-4332

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  621.35

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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