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Electrical properties of metal/GaN and SiO2/GaN interfaces and effects of thermal annealing
Electrical properties of metal/GaN and SiO2/GaN interfaces and effects of thermal annealing
Electrical properties of metal/GaN and SiO2/GaN interfaces and effects of thermal annealing
Sawada, T. (Autor:in) / Ito, Y. (Autor:in) / Imai, K. (Autor:in) / Suzuki, K. (Autor:in) / Tomozawa, H. (Autor:in) / Sakai, S. (Autor:in)
APPLIED SURFACE SCIENCE ; 159-160 ; 449-455
01.01.2000
7 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
621.35
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