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Electrically detected magnetic resonance of near-interface defects in Si pn-junction structures with LOCOS isolation
Electrically detected magnetic resonance of near-interface defects in Si pn-junction structures with LOCOS isolation
Electrically detected magnetic resonance of near-interface defects in Si pn-junction structures with LOCOS isolation
Wimbauer, T. (author) / Mochizuki, Y. (author) / Ito, K. (author) / Horikawa, M. (author) / Kitano, T. (author)
APPLIED SURFACE SCIENCE ; 159-160 ; 72-74
2000-01-01
3 pages
Article (Journal)
English
DDC:
621.35
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