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Electrically detected magnetic resonance of near-interface defects in Si pn-junction structures with LOCOS isolation
Electrically detected magnetic resonance of near-interface defects in Si pn-junction structures with LOCOS isolation
Electrically detected magnetic resonance of near-interface defects in Si pn-junction structures with LOCOS isolation
Wimbauer, T. (Autor:in) / Mochizuki, Y. (Autor:in) / Ito, K. (Autor:in) / Horikawa, M. (Autor:in) / Kitano, T. (Autor:in)
APPLIED SURFACE SCIENCE ; 159-160 ; 72-74
01.01.2000
3 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
621.35
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