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    High-resolution electron microscopy observation of grain-boundary films in superplastically deformed silicon nitride

    New search for: Zhan, G.-D.
    New search for: Mitomo, M.
    New search for: Ikuhara, Y.
    New search for: Sakuma, T.

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    High-resolution electron microscopy observation of grain-boundary films in superplastically deformed silicon nitride

    New search for: Zhan, G.-D.
    New search for: Mitomo, M.
    New search for: Ikuhara, Y.
    New search for: Sakuma, T.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    High-resolution electron microscopy observation of grain-boundary films in superplastically deformed silicon nitride

    New search for: Zhan, G.-D.
    New search for: Mitomo, M.
    New search for: Ikuhara, Y.
    New search for: Sakuma, T.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Page navigation

    Document information
    Similar titles

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    Document information
    Title:

    High-resolution electron microscopy observation of grain-boundary films in superplastically deformed silicon nitride

    Contributors:

    Zhan, G.-D. (author) / Mitomo, M. (author) / Ikuhara, Y. (author) / Sakuma, T. (author)

    Published in:

    JOURNAL OF MATERIALS RESEARCH -PITTSBURGH- ; 15 ; 1551-1555

    Publication date:

    2000-01-01

    Size:

    5 pages

    ISSN:

    0884-2914

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  620.11

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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