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    Interface crack interacting with a microvoid in the near-tip process zone

    New search for: Jian-Jun, H.
    New search for: Yi-Heng, C.

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    Interface crack interacting with a microvoid in the near-tip process zone

    New search for: Jian-Jun, H.
    New search for: Yi-Heng, C.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Interface crack interacting with a microvoid in the near-tip process zone

    New search for: Jian-Jun, H.
    New search for: Yi-Heng, C.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

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    Document information
    Similar titles

    Export, share and cite

    Document information
    Title:

    Interface crack interacting with a microvoid in the near-tip process zone

    Contributors:

    Jian-Jun, H. (author) / Yi-Heng, C. (author)

    Published in:

    INTERNATIONAL JOURNAL OF FRACTURE ; 102 ; 223-244

    Publication date:

    2000-01-01

    Size:

    22 pages

    ISSN:

    0376-9429

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  620.1126

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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