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    Trap creation in ultrathin SiO2 films due to electron injection studied by scanning tunneling microscopy/scanning tunneling spectroscopy

    New search for: Ohmori, K.
    New search for: Zaima, S.
    New search for: Yasuda, Y.

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    Trap creation in ultrathin SiO2 films due to electron injection studied by scanning tunneling microscopy/scanning tunneling spectroscopy

    New search for: Ohmori, K.
    New search for: Zaima, S.
    New search for: Yasuda, Y.

    Access

    Access via TIB
    Check availability in my library
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    Trap creation in ultrathin SiO2 films due to electron injection studied by scanning tunneling microscopy/scanning tunneling spectroscopy

    New search for: Ohmori, K.
    New search for: Zaima, S.
    New search for: Yasuda, Y.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

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    Document information
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    Document information
    Title:

    Trap creation in ultrathin SiO2 films due to electron injection studied by scanning tunneling microscopy/scanning tunneling spectroscopy

    Contributors:

    Ohmori, K. (author) / Zaima, S. (author) / Yasuda, Y. (author)

    Published in:

    APPLIED SURFACE SCIENCE ; 162/163 ; 395-400

    Publication date:

    2000-01-01

    Size:

    6 pages

    ISSN:

    0169-4332

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  621.35

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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