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Temperature effect on the reconstruction of Sb/Si(001) interface studied by high resolution core level spectroscopy and RHEED analysis
Temperature effect on the reconstruction of Sb/Si(001) interface studied by high resolution core level spectroscopy and RHEED analysis
Temperature effect on the reconstruction of Sb/Si(001) interface studied by high resolution core level spectroscopy and RHEED analysis
De Padova, P. (author) / Larciprete, R. (author) / Quaresima, C. (author) / Reginelli, A. (author) / Perfetti, P. (author)
APPLIED SURFACE SCIENCE ; 166 ; 214-219
2000-01-01
6 pages
Article (Journal)
English
DDC:
621.35
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