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    Advances in In Situ Ultra-High Vacuum Electron Microscopy: Growth of SiGe on Si

    New search for: Tromp, R. M.
    New search for: Ross, F. M.

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    Advances in In Situ Ultra-High Vacuum Electron Microscopy: Growth of SiGe on Si

    New search for: Tromp, R. M.
    New search for: Ross, F. M.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Advances in In Situ Ultra-High Vacuum Electron Microscopy: Growth of SiGe on Si

    New search for: Tromp, R. M.
    New search for: Ross, F. M.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

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    Document information
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    Document information
    Title:

    Advances in In Situ Ultra-High Vacuum Electron Microscopy: Growth of SiGe on Si

    Contributors:

    Tromp, R. M. (author) / Ross, F. M. (author)

    Published in:

    ANNUAL REVIEW OF MATERIALS SCIENCE ; 30 ; 431-449

    Publication date:

    2000-01-01

    Size:

    19 pages

    ISSN:

    0084-6600

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  620.11

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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