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Structural and topographical studies of SILAR-grown highly oriented PbS thin films

Kanniainen, T. / Lindroos, S. / Resch, R. / Leskela, M. / Friedbacher, G. / Grasserbauer, M.

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Structural and topographical studies of SILAR-grown highly oriented PbS thin films

Kanniainen, T. / Lindroos, S. / Resch, R. / Leskela, M. / Friedbacher, G. / Grasserbauer, M.

Structural and topographical studies of SILAR-grown highly oriented PbS thin films

Kanniainen, T. / Lindroos, S. / Resch, R. / Leskela, M. / Friedbacher, G. / Grasserbauer, M.

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Document information

Title:

Structural and topographical studies of SILAR-grown highly oriented PbS thin films

Contributors:

Kanniainen, T. (author) / Lindroos, S. (author) / Resch, R. (author) / Leskela, M. (author) / Friedbacher, G. (author) / Grasserbauer, M. (author)

Published in:

MATERIALS RESEARCH BULLETIN ; 35 ; 1045-1051

Publication date:

2000-01-01

Size:

7 pages

ISSN:

0025-5408

Type of media:

Article (Journal)

Type of material:

Language:

English

Classification:

DDC: 620.11 / 620

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