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X-ray photoelectron spectroscopic measurements on glassy Ge20S80-xBix (x=0,16)
X-ray photoelectron spectroscopic measurements on glassy Ge20S80-xBix (x=0,16)
X-ray photoelectron spectroscopic measurements on glassy Ge20S80-xBix (x=0,16)
Saffarini, G. (author) / Saiter, J. M. (author)
MATERIALS LETTERS ; 46 ; 327-331
2000-01-01
5 pages
Article (Journal)
English
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