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X-ray photoelectron spectroscopic measurements on glassy Ge20S80-xBix (x=0,16)
X-ray photoelectron spectroscopic measurements on glassy Ge20S80-xBix (x=0,16)
X-ray photoelectron spectroscopic measurements on glassy Ge20S80-xBix (x=0,16)
Saffarini, G. (Autor:in) / Saiter, J. M. (Autor:in)
MATERIALS LETTERS ; 46 ; 327-331
01.01.2000
5 pages
Aufsatz (Zeitschrift)
Englisch
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