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Surface charge analysis characterisation of ultraviolet-induced damage in silicon nitride dielectrics
Surface charge analysis characterisation of ultraviolet-induced damage in silicon nitride dielectrics
Surface charge analysis characterisation of ultraviolet-induced damage in silicon nitride dielectrics
Korowicz, D. H. (author) / Kelly, P. V. (author) / Mongey, K. F. (author) / Crean, G. M. (author)
APPLIED SURFACE SCIENCE ; 168 ; 304-306
2000-01-01
3 pages
Article (Journal)
English
DDC:
621.35
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