Eine Plattform für die Wissenschaft: Bauingenieurwesen, Architektur und Urbanistik
Surface charge analysis characterisation of ultraviolet-induced damage in silicon nitride dielectrics
Surface charge analysis characterisation of ultraviolet-induced damage in silicon nitride dielectrics
Surface charge analysis characterisation of ultraviolet-induced damage in silicon nitride dielectrics
Korowicz, D. H. (Autor:in) / Kelly, P. V. (Autor:in) / Mongey, K. F. (Autor:in) / Crean, G. M. (Autor:in)
APPLIED SURFACE SCIENCE ; 168 ; 304-306
01.01.2000
3 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
621.35
© Metadata Copyright the British Library Board and other contributors. All rights reserved.
Vacuum Ultraviolet Deposition of Silicon Dielectrics
British Library Online Contents | 1995
|Surface Photo-Charge Effect in Dielectrics
British Library Online Contents | 1994
|Microstructural Characterisation of Silicon Nitride-bonded Silicon Carbide
British Library Online Contents | 1994
|Fabrication of Porous Silicon Nitride and Characterisation of Mechanical Properties
British Library Online Contents | 2003
|