A Comparison between SiO~2/4H-SiC Interface Traps on (0001) and (1120) Faces

Olafsson, H. O. / Hallin, C. / Sveinbjornsson, E. O. | British Library Online Contents | 2004

Defect Characterization of Homo-Epitaxially Grown 6H-SiC on (0001) Silicon and (0001) Carbon Faces

Stoemenos, J. / Di Cioccio, L. / Papaioannou, V. et al. | British Library Online Contents | 1998

Schottky Barriers for Pt on 6H and 4H-SiC (0001), (000&unknown;1), (1&unknown;100) and (1&unknown;210) Faces Measured by I-V, C-V and Internal Photoemission

Shigiltchoff, O. / Kimoto, T. / Hobgood, D. et al. | British Library Online Contents | 2002

Schottky Barriers for Pt, Mo and Ti on 6H and 4H SiC (0001), (000&unknown;), (1&unknown;00) and (1&unknown;10) Faces Measured by I-V, C-V and Internal Photoemission

Shigiltchoff, O. / Bai, S. / Devaty, R. P. et al. | British Library Online Contents | 2003

Pd/GaN(0001) interface properties

Grodzicki, M. / Mazur, P. / Zuber, S. et al. | British Library Online Contents | 2014