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A Comparison between SiO~2/4H-SiC Interface Traps on (0001) and (1120) Faces
A Comparison between SiO~2/4H-SiC Interface Traps on (0001) and (1120) Faces
A Comparison between SiO~2/4H-SiC Interface Traps on (0001) and (1120) Faces
Olafsson, H. O. (author) / Hallin, C. (author) / Sveinbjornsson, E. O. (author)
MATERIALS SCIENCE FORUM ; 457/460 ; 1305-1308
2004-01-01
4 pages
Article (Journal)
English
DDC:
620.11
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