Structural characterization of partially crystallized phases embedded in low temperature MOCVD-grown PbTiO~3 thin films: Fid-Bau Portal

Structural characterization of partially crystallized phases embedded in low temperature MOCVD-grown PbTiO~3 thin films

Wang, C. H. / Choi, D. J.

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Structural characterization of partially crystallized phases embedded in low temperature MOCVD-grown PbTiO~3 thin films

Wang, C. H. / Choi, D. J.

Structural characterization of partially crystallized phases embedded in low temperature MOCVD-grown PbTiO~3 thin films

Wang, C. H. / Choi, D. J.

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Check availability in my library

Order at Subito €

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Document information

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Document information

Title:

Structural characterization of partially crystallized phases embedded in low temperature MOCVD-grown PbTiO~3 thin films

Contributors:

Wang, C. H. (author) / Choi, D. J. (author)

Published in:

JOURNAL OF MATERIALS SCIENCE LETTERS ; 19 ; 1505-1508

Publication date:

2000-01-01

Size:

4 pages

ISSN:

0261-8028

Type of media:

Article (Journal)

Type of material:

Language:

English

Classification:

DDC: 620.11

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