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Analytical evaluation of tapping mode atomic force microscopy for chemical imaging of surfaces
Analytical evaluation of tapping mode atomic force microscopy for chemical imaging of surfaces
Analytical evaluation of tapping mode atomic force microscopy for chemical imaging of surfaces
Basnar, B. (author) / Friedbacher, G. (author) / Brunner, H. (author) / Vallant, T. (author) / Mayer, U. (author) / Hoffmann, H. (author)
APPLIED SURFACE SCIENCE ; 171 ; 213-225
2001-01-01
13 pages
Article (Journal)
English
DDC:
621.35
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