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    Analytical evaluation of tapping mode atomic force microscopy for chemical imaging of surfaces

    New search for: Basnar, B.
    New search for: Friedbacher, G.
    New search for: Brunner, H.
    New search for: Vallant, T.
    New search for: Mayer, U.
    New search for: Hoffmann, H.

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    Analytical evaluation of tapping mode atomic force microscopy for chemical imaging of surfaces

    New search for: Basnar, B.
    New search for: Friedbacher, G.
    New search for: Brunner, H.
    New search for: Vallant, T.
    New search for: Mayer, U.
    New search for: Hoffmann, H.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Analytical evaluation of tapping mode atomic force microscopy for chemical imaging of surfaces

    New search for: Basnar, B.
    New search for: Friedbacher, G.
    New search for: Brunner, H.
    New search for: Vallant, T.
    New search for: Mayer, U.
    New search for: Hoffmann, H.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Page navigation

    Document information
    Similar titles

    Export, share and cite

    Document information
    Title:

    Analytical evaluation of tapping mode atomic force microscopy for chemical imaging of surfaces

    Contributors:

    Basnar, B. (author) / Friedbacher, G. (author) / Brunner, H. (author) / Vallant, T. (author) / Mayer, U. (author) / Hoffmann, H. (author)

    Published in:

    APPLIED SURFACE SCIENCE ; 171 ; 213-225

    Publication date:

    2001-01-01

    Size:

    13 pages

    ISSN:

    0169-4332

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  621.35

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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