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Analytical evaluation of tapping mode atomic force microscopy for chemical imaging of surfaces
Analytical evaluation of tapping mode atomic force microscopy for chemical imaging of surfaces
Analytical evaluation of tapping mode atomic force microscopy for chemical imaging of surfaces
Basnar, B. (Autor:in) / Friedbacher, G. (Autor:in) / Brunner, H. (Autor:in) / Vallant, T. (Autor:in) / Mayer, U. (Autor:in) / Hoffmann, H. (Autor:in)
APPLIED SURFACE SCIENCE ; 171 ; 213-225
01.01.2001
13 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
621.35
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