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Focused microprobes of high energy ions - versatile analytical probes for surfaces, interfaces and devices
Focused microprobes of high energy ions - versatile analytical probes for surfaces, interfaces and devices
Focused microprobes of high energy ions - versatile analytical probes for surfaces, interfaces and devices
Jamieson, D. N. (author) / Bettiol, A. (author) / Yang, C. (author)
APPLIED SURFACE SCIENCE ; 169-170 ; 134-141
2001-01-01
8 pages
Article (Journal)
English
DDC:
621.35
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