Investigation of white etching layers on rails by optical microscopy, electron microscopy, X-ray and synchrotron X-ray diffraction: Fid-Bau Portal

Investigation of white etching layers on rails by optical microscopy, electron microscopy, X-ray and synchrotron X-ray diffraction

Osterle, W. / Rooch, H. / Pyzalla, A. / Wang, L.

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Investigation of white etching layers on rails by optical microscopy, electron microscopy, X-ray and synchrotron X-ray diffraction

Osterle, W. / Rooch, H. / Pyzalla, A. / Wang, L.

Investigation of white etching layers on rails by optical microscopy, electron microscopy, X-ray and synchrotron X-ray diffraction

Osterle, W. / Rooch, H. / Pyzalla, A. / Wang, L.

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Order at Subito €

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Document information

Title:

Investigation of white etching layers on rails by optical microscopy, electron microscopy, X-ray and synchrotron X-ray diffraction

Contributors:

Osterle, W. (author) / Rooch, H. (author) / Pyzalla, A. (author) / Wang, L. (author)

Published in:

MATERIALS SCIENCE AND ENGINEERING -LAUSANNE- A ; 303 ; 150 - 157

Publication date:

2001-01-01

Size:

8 pages

ISSN:

0921-5093

Type of media:

Article (Journal)

Type of material:

Language:

English

Classification:

DDC: 620.11

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