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A platform for research: civil engineering, architecture and urbanism
Non-ideal Schottky barrier model for impedance measurements of materials properties
Non-ideal Schottky barrier model for impedance measurements of materials properties
Non-ideal Schottky barrier model for impedance measurements of materials properties
Sikorski, S. (author) / Jung, W. (author)
MATERIALS SCIENCE IN SEMICONDUCTOR PROCESSING ; 4 ; 171-175
2001-01-01
5 pages
Article (Journal)
English
DDC:
621.38152
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