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    Simulation of scanning capacitance microscopy measurements on micro-sectioned and bevelled n+-p samples

    New search for: Ciampolini, L.
    New search for: Giannazzo, F.
    New search for: Ciappa, M.
    New search for: Fichtner, W.
    New search for: Raineri, V.

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    Simulation of scanning capacitance microscopy measurements on micro-sectioned and bevelled n+-p samples

    New search for: Ciampolini, L.
    New search for: Giannazzo, F.
    New search for: Ciappa, M.
    New search for: Fichtner, W.
    New search for: Raineri, V.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Simulation of scanning capacitance microscopy measurements on micro-sectioned and bevelled n+-p samples

    New search for: Ciampolini, L.
    New search for: Giannazzo, F.
    New search for: Ciappa, M.
    New search for: Fichtner, W.
    New search for: Raineri, V.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

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    Document information
    Similar titles

    Export, share and cite

    Document information
    Title:

    Simulation of scanning capacitance microscopy measurements on micro-sectioned and bevelled n+-p samples

    Contributors:

    Ciampolini, L. (author) / Giannazzo, F. (author) / Ciappa, M. (author) / Fichtner, W. (author) / Raineri, V. (author)

    Published in:

    MATERIALS SCIENCE IN SEMICONDUCTOR PROCESSING ; 4 ; 85-88

    Publication date:

    2001-01-01

    Size:

    4 pages

    ISSN:

    1369-8001

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  621.38152

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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