A Raman study of GaAsN, GaInAsN layers on bevelled samples: Fid-Bau Portal

A Raman study of GaAsN, GaInAsN layers on bevelled samples

Srnanek, R. / Vincze, A. / Kovac, J. / Gregora, I. / Mc Phail, D. S. / Gottschalch, V.

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A Raman study of GaAsN, GaInAsN layers on bevelled samples

Srnanek, R. / Vincze, A. / Kovac, J. / Gregora, I. / Mc Phail, D. S. / Gottschalch, V.

A Raman study of GaAsN, GaInAsN layers on bevelled samples

Srnanek, R. / Vincze, A. / Kovac, J. / Gregora, I. / Mc Phail, D. S. / Gottschalch, V.

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Document information

Title:

A Raman study of GaAsN, GaInAsN layers on bevelled samples

Contributors:

Srnanek, R. (author) / Vincze, A. (author) / Kovac, J. (author) / Gregora, I. (author) / Mc Phail, D. S. (author) / Gottschalch, V. (author)

Published in:

MATERIALS SCIENCE AND ENGINEERING B -LAUSANNE- ; 91-92 ; 87 - 90

Publication date:

2002-01-01

Size:

4 pages

ISSN:

0921-5107

Type of media:

Article (Journal)

Type of material:

Language:

English

Classification:

DDC: 620.11

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