A platform for research: civil engineering, architecture and urbanism
Correlation between hot-electron-stress-induced degradation and cathodoluminescence in InP-based HEMTs
Correlation between hot-electron-stress-induced degradation and cathodoluminescence in InP-based HEMTs
Correlation between hot-electron-stress-induced degradation and cathodoluminescence in InP-based HEMTs
Salviati, G. (author) / Armani, N. (author) / Cova, P. (author) / Meneghesso, G. (author) / Zanoni, E. (author)
MATERIALS SCIENCE AND ENGINEERING -LAUSANNE- B ; 80 ; 289 - 293
2001-01-01
5 pages
Article (Journal)
English
DDC:
620.11
© Metadata Copyright the British Library Board and other contributors. All rights reserved.
British Library Online Contents | 2011
|Hot Electron Induced Current Collapse in AlGaN/GaN HEMTs
British Library Online Contents | 2007
|Correlation between static characteristics and deep levels in InAlAs/InGaAs/InP HEMTS
British Library Online Contents | 2006
|British Library Online Contents | 1996
|British Library Online Contents | 1996
|